Part Number Hot Search : 
FOD3150S 5945B SMAU1G BZT52C BF494 TDA7433 TCET1202 MFWATS
Product Description
Full Text Search
 

To Download IS61LV2568-10KI Datasheet File

  If you can't view the Datasheet, Please click here to try to view without PDF Reader .  
 
 


  Datasheet File OCR Text:
 IS61LV2568
256K x 8 HIGH-SPEED CMOS STATIC RAM
FEATURES
* High-speed access times: 10 and 12 ns * High-performance, low-power CMOS process * Multiple center power and ground pins for greater noise immunity * Easy memory expansion with CE and OE options * CE power-down * Low power: 540 mW @ 10 ns 36 mW standby mode * TTL compatible inputs and outputs * Single 3.3V 10% power supply * Packages available: - 36-pin 400-mil SOJ - 44-pin TSOP (Type II)
ISSI
(R)
FEBRUARY 2003
DESCRIPTION The ISSI IS61LV2568 is a very high-speed, low power,
262,144-word by 8-bit CMOS static RAM. The IS61LV2568 is fabricated using ISSI's high-performance CMOS technology. This highly reliable process coupled with innovative circuit design techniques, yields higher performance and low power consumption devices. When CE is HIGH (deselected), the device assumes a standby mode at which the power dissipation can be reduced down to 36mW (max.) with CMOS input levels. The IS61LV2568 operates from a single 3.3V power supply and all inputs are TTL-compatible. The IS61LV2568 is available in 36-pin 400-mil SOJ, and 44-pin TSOP (Type II) packages.
FUNCTIONAL BLOCK DIAGRAM
A0-A17
DECODER
256K X 8 MEMORY ARRAY
VDD GND I/O DATA CIRCUIT
I/O0-I/O7
COLUMN I/O
CE OE WE CONTROL CIRCUIT
Copyright (c) 2003 Integrated Silicon Solution, Inc. All rights reserved. ISSI reserves the right to make changes to this specification and its products at any time without notice. ISSI assumes no liability arising out of the application or use of any information, products or services described herein. Customers are advised to obtain the latest version of this device specification before relying on any published information and before placing orders for products.
Integrated Silicon Solution, Inc. -- 1-800-379-4774
Rev. B 02/07/03
1
IS61LV2568
PIN CONFIGURATION
36-Pin SOJ 44-Pin TSOP (Type II)
ISSI
36 35 34 33 32 31 30 29 28 27 26 25 24 23 22 21 20 19 NC A5 A6 A7 A8 OE I/O7 I/O6 GND VDD I/O5 I/O4 A9 A10 A11 A12 NC NC
NC NC A4 A3 A2 A1 A0 CE I/O0 I/O1 VDD GND I/O2 I/O3 WE A17 A16 A15 A14 A13 NC NC 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 44 43 42 41 40 39 38 37 36 35 34 33 32 31 30 29 28 27 26 25 24 23 NC NC NC A5 A6 A7 A8 OE I/O7 I/O6 GND VDD I/O5 I/O4 A9 A10 A11 A12 NC NC NC NC
(R)
A4 A3 A2 A1 A0 CE I/O0 I/O1 VDD GND I/O2 I/O3 WE A17 A16 A15 A14 A13
1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18
PIN DESCRIPTIONS
A0-A17 CE OE WE I/O0-I/O7 VDD GND NC Address Inputs Chip Enable Input Output Enable Input Write Enable Input Bidirectional Ports Power Ground No Connection
2
Integrated Silicon Solution, Inc. -- 1-800-379-4774
Rev. B 02/07/03
IS61LV2568
TRUTH TABLE
Mode WE X H H L CE H L L L OE X H L X I/O Operation High-Z High-Z DOUT DIN VDD Current ISB1, ISB2 ICC ICC ICC Not Selected (Power-down) Output Disabled Read Write
ISSI
(R)
ABSOLUTE MAXIMUM RATINGS(1)
Symbol VDD VTERM TSTG PD Parameter Supply voltage with Respect to GND Terminal Voltage with Respect to GND Storage Temperature Power Dissipation Value -0.5 to +4.6 -0.5 to VDD + 0.5 -65 to +150 1.0 Unit V V C W
Notes: 1. Stress greater than those listed under ABSOLUTE MAXIMUM RATINGS may cause permanent damage to the device. This is a stress rating only and functional operation of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect reliability.
OPERATING RANGE
Range Commercial Industrial Ambient Temperature 0C to +70C -40C to +85C VDD 3.3V 10% 3.3V 10%
Integrated Silicon Solution, Inc. -- 1-800-379-4774
Rev. B 02/07/03
3
IS61LV2568
DC ELECTRICAL CHARACTERISTICS (Over Operating Range)
Symbol Parameter VOH VOL VIH VIL ILI ILO Output HIGH Voltage Output LOW Voltage Input HIGH Voltage(1) Input LOW Voltage Input Leakage Output Leakage
(1)
ISSI
Test Conditions VDD = Min., IOH = -4.0 mA VDD = Min., IOL = 8.0 mA Min. 2.4 -- 2.0 -0.3 GND VIN VDD GND VOUT VDD, Outputs Disabled Com. Ind. Com. Ind. -1 -5 -1 -5 Max. -- 0.4 VDD + 0.3 0.8 1 5 1 5
(R)
Unit V V V V A A
Note: 1. VIL(min) = -0.3V (DC); VIL(min) = -2.0V (pulse width - 2.0 ns). VIH(max) = VDD + 0.3V (DC); VIH(max) = VDD + 2.0V (pulse width - 2.0 ns).
POWER SUPPLY CHARACTERISTICS(1) (Over Operating Range)
-10 ns Symbol ICC ISB1 Parameter VDD Operating Supply Current TTL Standby Current (TTL Inputs) CMOS Standby Current (CMOS Inputs) Test Conditions VDD = Max., CE = VIL IOUT = 0 mA, f = Max. VDD = Max., VIN = VIH or VIL CE VIH, f = max VDD = Max., CE VDD - 0.2V, VIN VDD - 0.2V, or VIN 0.2V, f = 0 Com. Ind. Com. Ind. Com. Ind. Min. Max. -- -- -- -- -- -- 125 135 40 50 10 20 -12 ns Min. Max. -- -- -- -- -- -- 110 120 35 45 10 20 Unit mA mA
ISB2
mA
Note: 1. At f = fMAX, address and data inputs are cycling at the maximum frequency, f = 0 means no input lines change.
CAPACITANCE(1,2)
Symbol CIN CI/O Parameter Input Capacitance Input/Output Capacitance Conditions VIN = 0V VOUT = 0V Max. 6 8 Unit pF pF
Notes: 1. Tested initially and after any design or process changes that may affect these parameters. 2. Test conditions: TA = 25C, f = 1 MHz, VDD = 3.3V.
4
Integrated Silicon Solution, Inc. -- 1-800-379-4774
Rev. B 02/07/03
IS61LV2568
AC TEST CONDITIONS
Parameter Input Pulse Level Input Rise and Fall Times Input and Output Timing and Reference Levels Output Load Unit 0V to 3.0V 3 ns 1.5V See Figures 1 and 2
ISSI
(R)
AC TEST LOADS
319 3.3V
319 3.3V
OUTPUT 30 pF Including jig and scope 353
OUTPUT 5 pF Including jig and scope 353
Figure 1
Figure 2
READ CYCLE SWITCHING CHARACTERISTICS(1) (Over Operating Range)
Symbol Parameter -10 ns Min. Max. 10 -- 3 -- -- 0 0 3 0 -- 10 -- 10 4 -- 4 -- 4 -12 ns Min. Max. 12 -- 3 -- -- 0 0 3 0 -- 12 -- 12 5 -- 5 -- 5 Unit ns ns ns ns ns ns ns ns ns
tRC tAA tOHA tACE tDOE tLZOE(2) tHZOE(2) tLZCE
(2) (2)
Read Cycle Time Address Access Time Output Hold Time CE Access Time OE Access Time OE to Low-Z Output OE to High-Z Output CE to Low-Z Output CE to High-Z Output
tHZCE
Notes: 1. Test conditions assume signal transition times of 3 ns or less, timing reference levels of 1.5V, input pulse levels of 0 to 3.0V and output loading specified in Figure 1. 2. Tested with the load in Figure 2. Transition is measured 200 mV from steady-state voltage. Not 100% tested.
Integrated Silicon Solution, Inc. -- 1-800-379-4774
Rev. B 02/07/03
5
IS61LV2568
AC WAVEFORMS READ CYCLE NO. 1(1,2) (Address Controlled) (CE = OE = VIL)
t RC
ADDRESS
ISSI
(R)
t AA t OHA
DOUT
PREVIOUS DATA VALID
t OHA
DATA VALID
READ1.eps
READ CYCLE NO. 2(1,3) (CE and OE Controlled)
t RC
ADDRESS
t AA
OE
t OHA
t DOE
CE
t HZOE
t LZOE t ACE t LZCE t HZCE
DATA VALID
CE_RD2.eps
DOUT
HIGH-Z
Notes: 1. WE is HIGH for a Read Cycle. 2. The device is continuously selected. OE, CE = VIL. 3. Address is valid prior to or coincident with CE LOW transitions.
6
Integrated Silicon Solution, Inc. -- 1-800-379-4774
Rev. B 02/07/03
IS61LV2568
WRITE CYCLE SWITCHING CHARACTERISTICS(1,2) (Over Operating Range)
Symbol Parameter -10 ns Min. Max. 10 8 8 0 0 7 8 5 0 -- 0 -- -- -- -- -- -- -- -- -- 4 -- -12 ns Min. Max. 12 9 9 0 0 8 10 6 0 -- 0 -- -- -- -- -- -- -- -- -- 5 -- Unit ns ns ns ns ns ns ns ns ns ns ns
ISSI
(R)
tWC tSCE tAW tHA tSA tPWE1 tPWE2 tSD tHD
Write Cycle Time CE to Write End Address Setup Time to Write End Address Hold from Write End Address Setup Time WE Pulse Width (OE = HIGH) WE Pulse Width (OE = LOW) Data Setup to Write End Data Hold from Write End
tHZWE(3) WE LOW to High-Z Output tLZWE(3) WE HIGH to Low-Z Output
Notes: 1. Test conditions assume signal transition times of 3 ns or less, timing reference levels of 1.5V, input pulse levels of 0 to 3.0V and output loading specified in Figure 1. 2. The internal write time is defined by the overlap of CE LOW and WE LOW. All signals must be in valid states to initiate a Write, but any one can go inactive to terminate the Write. The Data Input Setup and Hold timing are referenced to the rising or falling edge of the signal that terminates the Write. 3. Tested with the load in Figure 2. Transition is measured 500 mV from steady-state voltage. Not 100% tested.
AC WAVEFORMS WRITE CYCLE NO. 1(1,2) (CE Controlled, OE = HIGH or LOW)
t WC
ADDRESS
VALID ADDRESS
t SA
CE
t SCE
t HA
WE
t AW t PWE1 t PWE2 t HZWE t LZWE
HIGH-Z
DOUT
DATA UNDEFINED
t SD
DIN
t HD
DATAIN VALID
CE_WR1.eps
Note: 1. The internal Write time is defined by the overlap of CE = LOW and WE = LOW. All signals must be in valid states to initiate a Write, but any can be deasserted to terminate the Write. The Data Input Setup and Hold timing is referenced to the rising or falling edge of the signal that terminates the Write.
Integrated Silicon Solution, Inc. -- 1-800-379-4774
Rev. B 02/07/03
7
IS61LV2568
AC WAVEFORMS WRITE CYCLE NO. 2(1) (WE Controlled, OE = HIGH during Write Cycle)
t WC
ADDRESS
VALID ADDRESS
ISSI
(R)
t HA
OE
CE
LOW
t AW t PWE1
WE
t SA
DOUT
DATA UNDEFINED
t HZWE
HIGH-Z
t LZWE
t SD
DIN
t HD
DATAIN VALID
CE_WR2.eps
Note: 1. The internal Write time is defined by the overlap of CE = LOW and WE = LOW. All signals must be in valid states to initiate a Write, but any can be deasserted to terminate the Write. The Data Input Setup and Hold timing is referenced to the rising or falling edge of the signal that terminates the Write.
WRITE CYCLE NO. 3 (WE Controlled: OE is LOW During Write Cycle)
t WC
ADDRESS
VALID ADDRESS
OE CE
LOW
t HA
LOW
t AW t PWE2
WE
t SA
DOUT
DATA UNDEFINED
t HZWE
HIGH-Z
t LZWE
t SD
DIN
t HD
DATAIN VALID
CE_WR3.eps
Note: 1. The internal Write time is defined by the overlap of CE = LOW and WE = LOW. All signals must be in valid states to initiate a Write, but any can be deasserted to terminate the Write. The Data Input Setup and Hold timing is referenced to the rising or falling edge of the signal that terminates the Write.
8
Integrated Silicon Solution, Inc. -- 1-800-379-4774
Rev. B 02/07/03
IS61LV2568
ORDERING INFORMATION Commercial Range: 0C to +70C
Speed (ns) 10 12 Order Part No. IS61LV2568-10K IS61LV2568-10T IS61LV2568-12K IS61LV2568-12T Package 400-mil Plastic SOJ TSOP (Type II) 400-mil Plastic SOJ TSOP (Type II)
ISSI
(R)
ORDERING INFORMATION Industrial Range: -40C to +85C
Speed (ns) 10 12 Order Part No. IS61LV2568-10KI IS61LV2568-10TI IS61LV2568-12KI Package 400-mil Plastic SOJ TSOP (Type II) 400-mil Plastic SOJ
Integrated Silicon Solution, Inc. -- 1-800-379-4774
Rev. B 02/07/03
9


▲Up To Search▲   

 
Price & Availability of IS61LV2568-10KI

All Rights Reserved © IC-ON-LINE 2003 - 2022  

[Add Bookmark] [Contact Us] [Link exchange] [Privacy policy]
Mirror Sites :  [www.datasheet.hk]   [www.maxim4u.com]  [www.ic-on-line.cn] [www.ic-on-line.com] [www.ic-on-line.net] [www.alldatasheet.com.cn] [www.gdcy.com]  [www.gdcy.net]


 . . . . .
  We use cookies to deliver the best possible web experience and assist with our advertising efforts. By continuing to use this site, you consent to the use of cookies. For more information on cookies, please take a look at our Privacy Policy. X